Published September 2006
| Version v1
Journal article
Ultrafast imaging interferometry at femtosecond-laser-excited surfaces
Creators
- 1. Institut fuer Experimentelle Physik, Universitaet Duisburg-Essen, 45117 Essen (Germany)
- 2. Experimentelle Physik IIb, Universitaet Dortmund, 44221 Dortmund (Germany)
Description
A simple and robust setup for femtosecond time-resolved imaging interferometry of surfaces is described. The apparatus is capable of measuring both very small phase shifts (∼3x10-2 rad) and amplitude changes (∼1%) with micrometer spatial resolution (∼1 μm). Interferograms are processed using a 2D-Fourier transform algorithm. We discuss the image formation and the physical interpretation of the measured interferograms. The technique is applied to measure transient changes of a GaAs surface irradiated with intense femtosecond laser pulses with fluences near the ablation threshold
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of the Optical Society of America. Part B, Optical Physics
- Journal Volume
- 23
- Journal Issue
- 9
- Journal Page Range
- p. 1954-1964
- ISSN
- 0740-3224
- CODEN
- JOBPDE
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38023696
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ABLATION; ALGORITHMS; FOURIER TRANSFORMATION; GALLIUM ARSENIDES; IMAGE PROCESSING; IMAGES; INTERFEROMETRY; LASERS; MICHELSON INTERFEROMETER; PHASE SHIFT; PULSES; SPATIAL RESOLUTION; TIME RESOLUTION
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; GALLIUM COMPOUNDS; INTEGRAL TRANSFORMATIONS; INTERFEROMETERS; MATHEMATICAL LOGIC; MEASURING INSTRUMENTS; PNICTIDES; PROCESSING; RESOLUTION; TIMING PROPERTIES; TRANSFORMATIONS
Optional Information
- Notes
- (c) 2006 Optical Society of America