Published April 1972
| Version v1
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A secondary-ion mass spectrometer with electric quadrupoles of high detection sensitivity
Description
no abstract available
Availability note (English)
MF available from INIS under the Report Number.
Files
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The record is publicly accessible, but files are restricted to users with access.
Additional details
Additional titles
- Original title (German)
- Ein Sekundaerionenmassenspektrometer hoher Nachweisempfindlichkeit mit elektrischem Quadrupol
Publishing Information
- Imprint Pagination
- 9 p.
- Report number
- GSF-P--37
Conference
- Title
- 1972 spring meeting of the Deutsche Physikalische Gesellschaft.
- Dates
- 5 Apr 1972.
- Place
- Regensburg, F.R. Germany.
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 4046502
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTAL DOPING; DOPED MATERIALS; HEAVY IONS; ION EMISSION; ION IMPLANTATION; MASS SPECTROMETERS; QUADRUPOLES; QUANTITATIVE CHEMICAL ANALYSIS; SECONDARY EMISSION; SEMICONDUCTOR MATERIALS; SENSITIVITY
- Descriptors DEC
- CHARGED PARTICLES; CHEMICAL ANALYSIS; EMISSION; IONS; MEASURING INSTRUMENTS; MULTIPOLES; SPECTROMETERS
Optional Information
- Notes
- 8 figs.
- Secondary number(s)
- AED-Conf--72-046-015.