Elastic and surface energies: Two key parameters for CdSe quantum dot formation
Creators
- 1. Laboratoire de Spectrometrie Physique/CNRS UMR5588, Universite Joseph Fourier, Grenoble, BP87, 38402 St. Martin d'Heres (France)
Description
The two-dimensional-three-dimensional transition of a strained CdSe layer on (001) ZnSe induced by the use of amorphous selenium is studied. To precisely control the thickness of the CdSe layer, atomic layer epitaxy growth mode is used. Atomic force microscopy and reflection high-energy electron diffraction measurements reveal the formation of CdSe islands when 3 ML (monolayers) of CdSe, corresponding to the critical thickness, are deposited. When only 2.5 ML of CdSe are deposited another relaxation mechanism is observed, leading to the appearance of strong undulations on the surface. For a 3 ML thick CdSe layer, transmission electron microscopy images indicate that the formation of the islands occurs only after the amorphous selenium desorption
Additional details
Identifiers
- DOI
- 10.1063/1.2209202;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 88
- Journal Issue
- 23
- Journal Page Range
- p. 233103-233103.3
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37083683
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CADMIUM SELENIDES; CRYSTAL GROWTH; DESORPTION; ELECTRON DIFFRACTION; EPITAXY; LAYERS; QUANTUM DOTS; REFLECTION; SELENIUM; SEMICONDUCTOR MATERIALS; SURFACE ENERGY; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY; ZINC SELENIDES
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DIFFRACTION; DIMENSIONS; ELECTRON MICROSCOPY; ELEMENTS; ENERGY; FREE ENERGY; MATERIALS; MICROSCOPY; NANOSTRUCTURES; PHYSICAL PROPERTIES; SCATTERING; SELENIDES; SELENIUM COMPOUNDS; SEMIMETALS; SORPTION; SURFACE PROPERTIES; THERMODYNAMIC PROPERTIES; ZINC COMPOUNDS
Optional Information
- Notes
- (c) 2006 American Institute of Physics