Published July 1, 1991
| Version v1
Journal article
Angular distribution of reflections in Laue diffraction
- 1. Chemistry Dept., UMIST, Manchester (United Kingdom)
- 2. SERC Daresbury Lab., Warrington (United Kingdom)
- 3. Chemistry Dept., Univ. of Manchester (United Kingdom)
- 4. Section of Biochemistry, Molecular and Cell Biology, Cornell Univ., Ithaca, NY (United States)
Description
An analysis is presented of the angular distribution of reflections in Laue diffraction, with particular application to the spatial overlap problem in synchrotron macromolecular cristallography. Spatial overlaps of spots on the detector occur when the angular separations of adjacent diffracted beams are very small. The maximum density of spots occurs at θc=sin-1 (λminD*/2) and the majority of spots in this region of θ have short wavelengths. (orig./WL)
Additional details
Publishing Information
- Journal Title
- Acta Crystallographica. Section A: Foundations of Crystallography
- Journal Volume
- 47
- Journal Issue
- 4
- Series
- Acta Crystallogr., Sect. A: Found. Crystallogr.
- Journal Page Range
- 352-373
- ISSN
- 0108-7673
- CODEN
- ACACE
INIS
- Country of Publication
- Denmark
- Country of Input or Organization
- Denmark
- INIS RN
- 23029241
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANGULAR DISTRIBUTION; CRYSTAL LATTICES; CRYSTAL STRUCTURE; LAUE METHOD; REFLECTION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; DIFFRACTION METHODS; DISTRIBUTION; SCATTERING