New thermochromic bilayers for optical or electronic switching systems
Description
Thin films of thermochromic vanadium dioxide (with phase transition at Tc=68 deg. C) were covered by a cerium dioxide layer. Cerium dioxide was chosen for its chemical stability, infrared optical transparency and strong optical absorption in the ultraviolet range. The optical properties of these bilayers are comparable to optical properties of pure vanadium dioxide films. Vanadium dioxide was first deposited on a silica substrate by radio-frequency reactive sputtering. Later, a ceria thin film was deposited on the vanadium dioxide film by the same technique. The thin films were characterized by X-ray diffraction measurements, atomic force microscopy, scanning electron microscopy, transmission electron microscopy and ellipsometry techniques. Optical transmittance and optical switching efficiency were studied by Fourier transform infrared spectroscopy
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2003.10.013;
- PII
- S0040609003013932;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 449
- Journal Issue
- 1-2
- Journal Page Range
- p. 166-172
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37016651
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CERIUM OXIDES; ELLIPSOMETRY; FOURIER TRANSFORM SPECTROMETERS; LAYERS; OPACITY; PHASE TRANSFORMATIONS; RADIOWAVE RADIATION; SCANNING ELECTRON MICROSCOPY; SILICA; SPUTTERING; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET RADIATION; VANADIUM OXIDES; X-RAY DIFFRACTION
- Descriptors DEC
- CERIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; FILMS; MEASURING INSTRUMENTS; MEASURING METHODS; MICROSCOPY; MINERALS; OPTICAL PROPERTIES; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; RARE EARTH COMPOUNDS; SCATTERING; SPECTROMETERS; TRANSITION ELEMENT COMPOUNDS; VANADIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.