Study of Kβ to Kα X-ray intensity ratios induced by 84.5 MeV 12C4+ ions
Creators
- 1. Graduate Univ. of the Chinese Academy of Sciences, Beijing (China)
- 2. Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou (China)
- 3. Department of Modern Physics, Lanzhou Univ., Lanzhou (China)
Description
This experiment was completed in the National Laboratory of the Heavy Ion Research Facility in Institute of Modern Physics, Chinese Academy of sciences, Lanzhou. The K-shell X-rays arising from Cu, Mo, Ag, Cd, In, Sn, W, Au targets bombarded by 84.5 MeV 12C4+ ions have been measured by an ORTEC HPGe X-ray detector. The intensity ratios of Kβ to Kα X-ray arising from all of the metal targets measured in the present work were worked out and compared with the theoretical values which have been calculated by Scofield using Hartree-Fock-Slater wave functions as well as the experimental results obtained by other methods (such as decay radiation, target bombardment by photon, electrons, proton and so on). The comparison results show that the intensity ratios of Kβ to Kα X-ray arising from the metal targets following bombardment by 84.5 MeV 12C4+ ions used in the present work were distinctly larger than the theoretical values and the other experimental values. (authors)
Additional details
Publishing Information
- Journal Title
- Journal of Atomic and Molecular Physics
- Journal Volume
- 25
- Journal Issue
- 6
- Journal Page Range
- p. 1307-1311
- ISSN
- 1000-0364
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 42032550
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- CADMIUM; CARBON 12 BEAMS; COMPARATIVE EVALUATIONS; COPPER; GOLD; HARTREE-FOCK METHOD; HIGH-PURITY GE DETECTORS; INDIUM; ION-ATOM COLLISIONS; K SHELL; MEV RANGE 10-100; MOLYBDENUM; SILVER; TIN; TUNGSTEN; WAVE FUNCTIONS; X RADIATION
- Descriptors DEC
- APPROXIMATIONS; ATOM COLLISIONS; BEAMS; CALCULATION METHODS; COLLISIONS; ELECTROMAGNETIC RADIATION; ELECTRONIC STRUCTURE; ELEMENTS; ENERGY RANGE; EVALUATION; FUNCTIONS; GE SEMICONDUCTOR DETECTORS; ION BEAMS; ION COLLISIONS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; METALS; MEV RANGE; RADIATION DETECTORS; RADIATIONS; REFRACTORY METALS; SEMICONDUCTOR DETECTORS; TRANSITION ELEMENTS
Optional Information
- Notes
- 3 figs., 1 tab., 11 refs.