Structural change induced in TiO2 by swift heavy ions and its application to three-dimensional lithography
Creators
- 1. Tandem Accelerator Center, University of Tsukuba, Tsukuba 305-8577 (Japan)
- 2. Photonic Research Institute, National Institute of Advanced Industrial Science and Technology, Tsukuba Central 4, Tsukuba 305-8562 (Japan)
- 3. Department of Electrical, Electronics and Computer Engineering, Waseda University, Shinjuku, Tokyo 169-8555 (Japan)
Description
A rutile TiO2 single crystal was irradiated by heavy ions with a high energy of the order of several tens of MeV. A good etching selectivity, where only the irradiated surface is well etched by hydrofluoric acid is induced by the irradiation. Through x-ray diffraction and high-resolution electron microscopy, it became clear that the irradiated region lost crystallization. It is considered that this amorphous region and the surrounding region are dissolved in hydrofluoric acid. Through the calculation of the ion energy, it was found that the etching always stopped at the depth where the electronic stopping power of the ion decayed to a critical value of 6.2 keV/nm, regardless of the ion species in the case of I, Br, Cu, and Ti ions. However, in the case of Ca ions with energies higher than about 72 MeV or Cl ions with energies higher than about 77 MeV, the irradiated top surface was not etched with hydrofluoric acid, but the inside surface several μm deep from the irradiated surface was etched. A calculation shows that the critical factor which determines whether the irradiated surface can be etched or not is the lateral energy density on the surface deposited by ions. The etched surface observed by atomic force microscopy is very smooth with a roughness of the order of nm. Therefore, a combination of ion irradiation and etching can be used as a novel fabrication method of nanostructures in rutile
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter and Materials Physics
- Journal Volume
- 68
- Journal Issue
- 6
- Journal Page Range
- p. 064106-064106.8
- ISSN
- 1098-0121
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36005562
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- AMORPHOUS STATE; ATOMIC FORCE MICROSCOPY; CALCIUM IONS; CHLORINE IONS; CRYSTALLIZATION; DEPOSITS; ENERGY DENSITY; ETCHING; HEAVY IONS; HYDROFLUORIC ACID; ION BEAMS; IRRADIATION; KEV RANGE 01-10; MEV RANGE 10-100; MONOCRYSTALS; NANOSTRUCTURES; RUTILE; STOPPING POWER; SURFACES; TITANIUM IONS; TITANIUM OXIDES; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- BEAMS; CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELECTRON MICROSCOPY; ENERGY RANGE; FLUORINE COMPOUNDS; HALOGEN COMPOUNDS; HYDROGEN COMPOUNDS; INORGANIC ACIDS; INORGANIC COMPOUNDS; IONS; KEV RANGE; MATERIALS; MEV RANGE; MICROSCOPY; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; RADIOACTIVE MATERIALS; RADIOACTIVE MINERALS; SCATTERING; SURFACE FINISHING; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- (c) 2003 The American Physical Society