Published May 15, 2001 | Version v1
Journal article Metadata-only

Helium bubble and blister formation for nickel and an amorphous Fe-Ni-Mo-B alloy during 5 keV He+-irradiation at temperatures between 200 K and 600 K

Creators

  • 1. Limburgs Universitair Centrum, Diepenbeek (Belgium). Materials Physics Group

Description

The growth of helium bubbles and the formation of blisters during 5 keV He+ irradiation has been investigated for nickel and for the amorphous alloy Metglass 2826MB (Fe40Ni38Mo4B18) in the temperature range 200 K-600 K. Data on gas bubble growth for nickel can be interpreted in the framework of the loop punching model. A model for the growth of gas bubbles and the formation of blisters for amorphous alloys is presented. The model is based on the enhanced attraction of positive excess volume and helium by the overpressurized bubble. Similarities and differences of gas bubble formation and blistering for crystalline and amorphous alloys are discussed. (orig./TW)

Additional details

Publishing Information

Journal Title
Nucl. Instrum. Methods Phys. Res.
Journal Volume
209/210
Journal Issue
pt.1
Series
Nucl. Instrum. Methods Phys. Res.
Journal Page Range
461-468
ISSN
0029-554X

Conference

Title
3. international conference on ion beam modification of materials.
Dates
6-10 Sep 1982.
Place
Grenoble (France).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
15000318
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
AMORPHOUS STATE; BLISTERS; BORON ALLOYS; BUBBLES; COMPUTERIZED SIMULATION; ELECTRON MICROSCOPY; EXPERIMENTAL DATA; GROWTH; HELIUM IONS; HIGH TEMPERATURE; INTERSTITIALS; IRON ALLOYS; LOW TEMPERATURE; MEDIUM TEMPERATURE; MEV RANGE 01-10; MOLYBDENUM ALLOYS; NICKEL ALLOYS; RADIATION EFFECTS; TEMPERATURE DEPENDENCE; VACANCIES
Descriptors DEC
ALLOYS; CHARGED PARTICLES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DATA; ENERGY RANGE; INFORMATION; IONS; MEV RANGE; MICROSCOPY; NUMERICAL DATA; POINT DEFECTS; SIMULATION