Published May 3, 2024 | Version v1
Journal article

Write-error reduction in voltage-driven magnetization switching using a recording layer with low magnetic damping

  • 1. National Institute of Advanced Industrial Science and Technology (AIST), Research Center for Emerging Computing Technologies, Tsukuba, Ibaraki 305-8568, Japan

Description

We develop perpendicularly magnetized magnetic tunnel junctions consisting of a recording layer exhibiting a low magnetic damping to investigate the influence of magnetic damping on the write-error rate of voltage-driven magnetization switching. The effective magnetic damping is reduced to about one-third that of a conventional Ta/CoFeB/MgO recording layer by eliminating the spin pumping effect. The low magnetic damping contributes to a 3-orders-of-magnitude reduction in the write-error rate for the longer write pulses, which is explained by the suppression of thermal fluctuation during the switching process. The low magnetic damping also enables a long period of magnetization precession to control the dynamics via the voltage-controlled magnetic anisotropy effect.

Additional details

Identifiers

DOI
10.1103/PhysRevApplied.21.054008;
Crossref Funder ID
10.13039/501100001863;

Publishing Information

Journal Title
Physical Review Applied
Journal Volume
21
Journal Issue
5
Journal Page Range
7 pgs.
ISSN
2331-7019

Optional Information

Copyright
© 2024 American Physical Society
Notes
Contact Email: Corresponding author: yamamoto-t@aist.go.jp; Record automatically processed
Funding organization
New Energy and Industrial Technology Development Organization (NEDO)