Published December 2003
| Version v1
Journal article
Scattering of slow ions from insulator surfaces at the example of molecular oxygen from LiF(1 0 0)
Creators
Description
We scattered molecular oxygen ions at grazing incidence from a LiF(1 0 0) surface in the energy range from 880 to 3040 eV. About 50% molecular survival was obtained at the lowest primary energy of 881 eV and this dropped to about 4% at 3039 eV. Below 2 keV beam energy we found negative ion fractions of less than 2%, which increases up to 6% at about 3 keV primary energy. The molecular survival is much higher whereas the negative ion fraction is much lower compared to other insulating materials, i.e. diamond and MgO. The mean energy loss is found to increase linearly with energy and is in the order of a few percent
Additional details
Identifiers
- DOI
- 10.1016/S0168-583X(03)01838-X;
- arXiv
- arXiv:0808.1402v5;
- PII
- S0168583X0301838X;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 212
- Journal Issue
- 4
- Journal Page Range
- p. 291-296
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 20. international conference on atomic collisions in solids
- Acronym
- ICACS20
- Dates
- 19-24 Jan 2003
- Place
- Orissa (India)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Belarus
- INIS RN
- 35033769
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTRICAL INSULATORS; ENERGY LOSSES; EV RANGE 100-1000; KEV RANGE 01-10; LITHIUM FLUORIDES; MOLECULAR IONS; OXYGEN; SCATTERING; SURFACE IONIZATION; SURFACES
- Descriptors DEC
- ALKALI METAL COMPOUNDS; CHARGED PARTICLES; ELECTRICAL EQUIPMENT; ELEMENTS; ENERGY RANGE; EQUIPMENT; EV RANGE; FLUORIDES; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; IONIZATION; IONS; KEV RANGE; LITHIUM COMPOUNDS; LITHIUM HALIDES; LOSSES; NONMETALS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.