Infrared microthermography of microfabricated devices
- 1. U.S. Naval Research Laboratory, Code 6365, Washington, District of Columbia 20375 (United States)
Description
We report a new experimental apparatus for infrared microthermography applicable to a wide class of samples including semitransparent ones and perforated devices. This setup is particularly well suited for the thermography of microfabricated devices. Traditionally, temperature calibration is performed using calibration hot plates, but this is not applicable to transmissive samples. In this work a custom designed miniature calibration oven in conjunction with spatial filtering is used to obtain accurate static and transient temperature maps of actively heated devices. The procedure does not require prior knowledge of the emissivity. Calibration and image processing algorithms are discussed and analyzed. We show that relatively inexpensive uncooled bolometer arrays can be a suitable detector choice in certain radiometric applications. As an example, we apply this method in the analysis of temperature profiles of an actively heated microfabricated preconcentrator device that incorporates a perforated membrane and is used in trace detection of illicit substances
Additional details
Identifiers
- DOI
- 10.1063/1.2746573;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 78
- Journal Issue
- 6
- Journal Page Range
- p. 064903-064903.5
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38104757
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALGORITHMS; BOLOMETERS; CALIBRATION; DETECTION; EMISSIVITY; FILTERS; IMAGE PROCESSING; OVENS; THERMOGRAPHY
- Descriptors DEC
- APPLIANCES; EQUIPMENT; MATHEMATICAL LOGIC; MEASURING INSTRUMENTS; MEASURING METHODS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; PROCESSING; SURFACE PROPERTIES
Optional Information
- Notes
- (c) 2007 American Institute of Physics