Published June 2007 | Version v1
Journal article

Infrared microthermography of microfabricated devices

  • 1. U.S. Naval Research Laboratory, Code 6365, Washington, District of Columbia 20375 (United States)

Description

We report a new experimental apparatus for infrared microthermography applicable to a wide class of samples including semitransparent ones and perforated devices. This setup is particularly well suited for the thermography of microfabricated devices. Traditionally, temperature calibration is performed using calibration hot plates, but this is not applicable to transmissive samples. In this work a custom designed miniature calibration oven in conjunction with spatial filtering is used to obtain accurate static and transient temperature maps of actively heated devices. The procedure does not require prior knowledge of the emissivity. Calibration and image processing algorithms are discussed and analyzed. We show that relatively inexpensive uncooled bolometer arrays can be a suitable detector choice in certain radiometric applications. As an example, we apply this method in the analysis of temperature profiles of an actively heated microfabricated preconcentrator device that incorporates a perforated membrane and is used in trace detection of illicit substances

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
78
Journal Issue
6
Journal Page Range
p. 064903-064903.5
ISSN
0034-6748
CODEN
RSINAK

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38104757
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ALGORITHMS; BOLOMETERS; CALIBRATION; DETECTION; EMISSIVITY; FILTERS; IMAGE PROCESSING; OVENS; THERMOGRAPHY
Descriptors DEC
APPLIANCES; EQUIPMENT; MATHEMATICAL LOGIC; MEASURING INSTRUMENTS; MEASURING METHODS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; PROCESSING; SURFACE PROPERTIES

Optional Information

Notes
(c) 2007 American Institute of Physics