Published April 30, 2011 | Version v1
Journal article

Application of confocal laser microscopy for monitoring mesh implants in herniology

Description

The state of the surface of mesh implants and their encapsulation region in herniology is investigated by laser confocal microscopy. A correlation between the probability of developing relapses and the size and density of implant microdefects is experimentally shown. The applicability limits of differential reverse scattering for monitoring the post-operation state of implant and adjacent tissues are established based on model numerical experiments. (optical technologies in biophysics and medicine)

Availability note (English)

Available from http://dx.doi.org/10.1070/QE2011v041n04ABEH014594

Additional details

Publishing Information

Journal Title
Quantum Electronics (Woodbury, N.Y.)
Journal Volume
41
Journal Issue
4
Journal Page Range
p. 318-323
ISSN
1063-7818

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43028509
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
BIOPHYSICS; DEFECTS; DENSITY; ENCAPSULATION; IMPLANTS; LASERS; MICROSCOPY; MONITORING; PROBABILITY; SCATTERING; SURFACES
Descriptors DEC
PHYSICAL PROPERTIES; PHYSICS