Published April 30, 2011
| Version v1
Journal article
Application of confocal laser microscopy for monitoring mesh implants in herniology
Description
The state of the surface of mesh implants and their encapsulation region in herniology is investigated by laser confocal microscopy. A correlation between the probability of developing relapses and the size and density of implant microdefects is experimentally shown. The applicability limits of differential reverse scattering for monitoring the post-operation state of implant and adjacent tissues are established based on model numerical experiments. (optical technologies in biophysics and medicine)
Availability note (English)
Available from http://dx.doi.org/10.1070/QE2011v041n04ABEH014594Additional details
Identifiers
Publishing Information
- Journal Title
- Quantum Electronics (Woodbury, N.Y.)
- Journal Volume
- 41
- Journal Issue
- 4
- Journal Page Range
- p. 318-323
- ISSN
- 1063-7818
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43028509
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BIOPHYSICS; DEFECTS; DENSITY; ENCAPSULATION; IMPLANTS; LASERS; MICROSCOPY; MONITORING; PROBABILITY; SCATTERING; SURFACES
- Descriptors DEC
- PHYSICAL PROPERTIES; PHYSICS