Published 2011
| Version v1
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Dopant concentration determination in co-deposited organic thin films by XRF and RBS techniques
Creators
- 1. Pontificia Universidade Catolica do Rio de Janeiro (PUC-Rio), RJ (Brazil). Dept. of Physics
- 2. Inmetro, Xerem, RJ (Brazil). Material Div. (Dimat)
- 3. Universidade de Sao Paulo (USP), SP (Brazil). Dept. of Physics
- 4. Federal University of Juiz de Fora (UFJF), MG (Brazil). Physics Dept.
- 5. Universidade Federal de Sergipe (DFI/UFS), Sao Cristovao, SE (Brazil). Physics Dept.
Description
no abstract available
Files
43054734.pdf
Files
(105.1 kB)
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Additional details
Publishing Information
- Imprint Pagination
- [1 p.]
- Report number
- INIS-BR--11141
Conference
- Title
- Meeting on physics 2011. Physics integration in Latin America; 34. Brazilian national meeting on condensed matter physics
- Original Conference Title
- Encontro de Fisica 2011. Integracao da Fisica na America Latina
- Dates
- 5-10 Jun 2011
- Place
- Foz do Iguacu, PR (Brazil)
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 43054734
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract, Conference
- Descriptors DEI
- BACKSCATTERING; FLUORESCENCE SPECTROSCOPY; ION SPECTROSCOPY; LIGHT EMITTING DIODES; PHOSPHORESCENCE; QUANTITATIVE CHEMICAL ANALYSIS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; X RADIATION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; EMISSION; EMISSION SPECTROSCOPY; IONIZING RADIATIONS; LUMINESCENCE; NONDESTRUCTIVE ANALYSIS; PHOTON EMISSION; RADIATIONS; SCATTERING; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SPECTROSCOPY; X-RAY EMISSION ANALYSIS