Published August 2020
| Version v1
Journal article
Evaluation of energy-dispersive X-ray spectrometer with transition-edge sensor microcalorimeter on scanning transmission electron microscope for detection of low-concentration phosphorus in Fe-P alloy
Creators
- 1. Kobe Steel, Ltd., Applied Physics Research Laboratory, Kobe, Hyogo (Japan)
- 2. National Institute for Materials Science, Research Network and Facility Services Division, Tsukuba, Ibaraki (Japan)
- 3. Kyushu University, Department of Applied Science for Electronics and Materials, Kasuga, Fukuoka (Japan)
Description
An energy-dispersive X-ray spectrometer using a transition-edge sensor microcalorimeter with a scanning transmission electron microscope was applied to detect low concentrations of phosphorus (P) in an Fe–P–Mo–Mn alloy. The high energy resolution of 7.2 ± 0.9 eV was demonstrated in the measurements of P Kα signals, which were not visible in the spectra for a conventional silicon drift detector. The P detection limit estimated from the minimum mass fraction improves with the measurement time and is expected to be below 0.005 wt%. (author)
Availability note (English)
Available from DOI: https://doi.org/10.35848/1882-0786/aba7a9Additional details
Identifiers
Publishing Information
- Journal Title
- Applied Physics Express (Online)
- Journal Volume
- 13
- Journal Issue
- 8
- Journal Page Range
- p. 082008.1-082008.5
- ISSN
- 1882-0786
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 52035367
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CALORIMETERS; ENERGY RESOLUTION; GRAIN BOUNDARIES; IRON BASE ALLOYS; PHOSPHORUS; QUATERNARY ALLOY SYSTEMS; SEGREGATION; SI SEMICONDUCTOR DETECTORS; SQUID DEVICES; SUPERCONDUCTING FILMS; TRANSITION TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY; X-RAY SPECTRA; X-RAY SPECTROMETERS
- Descriptors DEC
- ALLOY SYSTEMS; ALLOYS; ELECTRON MICROSCOPY; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; FLUXMETERS; IRON ALLOYS; MEASURING INSTRUMENTS; MICROSCOPY; MICROSTRUCTURE; MICROWAVE EQUIPMENT; NONMETALS; PHYSICAL PROPERTIES; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SPECTRA; SPECTROMETERS; SUPERCONDUCTING DEVICES; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT ALLOYS
Optional Information
- Notes
- 30 refs., 5 figs.