Possibilities of secondary ions mass-spectrometry and neutral particles mass spectrometry under superconductor cuprates study

The review represents an effort to give information about the capabilities of secondary ion and neutral particle mass spectrometry methods (SIMS and SNMS respectively) under investigations into the superconducting cuprates. It is shown that these methods are of use only when solving different problems of superconducting oxide chemistry and technology. The SIMS method can be used to study HTSC-material homogeneity; film-substrate interaction; HTSC crystal structure fragments; oxygen diffusion. The SNMS method can be used to conduct a quantitative analysis of HTSC-materials, thin film analysis; to study cation diffusion