Published March 2004
| Version v1
Journal article
Bremsstrahlung excited standardless EDXRF analysis
Description
This paper demonstrates that samples can be directly exposed to an X-ray tube bremsstrahlung to obtain their elemental composition. For this purpose, the bremsstrahlung spectrum from an X-ray tube has been detected with a Si(Li) detector. A theoretical spectrum was generated which fitted well with the experimental one. Four samples of known composition were then irradiated in the tube bremsstrahlung. A computer program was developed to obtain the elemental composition of the samples. Results obtained by this method (without the necessity of using any standard sample) were found to be in good agreement with our earlier findings
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2003.09.030;
- PII
- S0168583X03020354;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 217
- Journal Issue
- 1
- Journal Page Range
- p. 104-112
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Syrian Arab Republic
- INIS RN
- 35071004
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- BREMSSTRAHLUNG; COMPUTER CODES; MULTI-ELEMENT ANALYSIS; SI SEMICONDUCTOR DETECTORS; SPECTRA; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.