Published June 2005 | Version v1
Journal article

Electronic structure of Au-Si(1 0 0) interface as a function of Au coverage

  • 1. Graduate School of Science, and Laboratory of Advanced Science and Technology for Industry, University of Hyogo, 3-1-2 Kouto, Kamigori, Ako 678-1205 (Japan)

Description

We have investigated the Au-Si(1 0 0) interface as a function of the Au coverage by means of the valence band and Au 4f core-level photoemission spectroscopy. At the initial stage of the Au deposition, deposited Au atoms are close to the atomic Au. With increasing the Au coverage, it is considered that the Au silicide is formed by the influence of the substrate Si atoms. From the relative intensity ratio of the Au 4f core-level spectrum to the Si 2p core-level spectrum, the appearance of the 3D islands was suggested at more than 12 ML. This means that the Au deposited surface is not homogeneous. In addition, it was found that there are two chemically different Au silicide components from the curve fitting analysis of the Au 4f core-level spectrum at the higher Au coverage

Additional details

Identifiers

DOI
10.1016/j.elspec.2005.01.078;
PII
S0368-2048(05)00075-7;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
144-147
Journal Page Range
p. 389-392
ISSN
0368-2048
CODEN
JESRAW

Conference

Title
14. international conference on vacuum ultraviolet radiation physics
Acronym
VUV 14
Dates
19-23 Jul 2004
Place
Cairns (Australia)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37039776
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMS; DEPOSITION; ELECTRONIC STRUCTURE; EMISSION SPECTRA; EMISSION SPECTROSCOPY; GOLD; INTERFACES; PHOTOEMISSION; SILICON; SUBSTRATES; SURFACES; SYNCHROTRON RADIATION; VALENCE
Descriptors DEC
BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; METALS; RADIATIONS; SECONDARY EMISSION; SEMIMETALS; SPECTRA; SPECTROSCOPY; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.