Published June 25, 2000
| Version v1
Journal article
Grazing incidence x-ray diffraction
Creators
- 1. Dept. of Physics and Astronomy, Northwestern Univ., Evanston (United States)
Description
X-rays have been used for decades to study the structure of bulk crystalline materials. They interact weakly with matter compared to (say) electrons, and thus are not normally thought of as surface-sensitive. However, in recent years techniques have been devised that, in combination with the availability of intense collimated beams from synchrotron sources, have transformed x-rays, into a versatile and powerful tool for the study of surfaces, monolayers and ultrathin films. This article briefly describes the principles of grazing incidence x-ray diffraction, and gives a few examples of results obtained using this technique. (author)
Additional details
Publishing Information
- Journal Title
- Current Science (Bangalore)
- Journal Volume
- 78
- Journal Issue
- 12
- Journal Page Range
- p. 1478-1483
- CODEN
- CUSCAM
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 31038931
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BRAGG CURVE; ORTHORHOMBIC LATTICES; PHASE DIAGRAMS; SYNCHROTRON RADIATION; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- BREMSSTRAHLUNG; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIAGRAMS; DIFFRACTION; ELECTROMAGNETIC RADIATION; FILMS; INFORMATION; RADIATIONS; SCATTERING
Optional Information
- Notes
- 22 refs., 7 figs.