Effects of emittance and space-charge in femtosecond bunch compression
- 1. Institute of Scientific and Industrial Research (ISIR), Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-0047 (Japan)
Description
Ultrashort electron bunches of the order of <100fs are essential for the study of ultrafast reactions and phenomena by means of time-resolved pump-probe experiments. In order to generate such an electron bunch, the effects of emittance, space-charge (SC) and coherent synchrotron radiation (CSR) on the bunch length in a femtosecond magnetic bunch compressor were studied theoretically. It was observed that the bunch length is dominated by the emittance, SC and CSR effects when the electron bunch is compressed into a femtosecond electron bunch. The increases in bunch length due to the transverse emittance, SC and CSR effects in the bunch compressor were 1.7 fs/mm mrad, 107 fs/nC and 72 fs/nC, respectively. Finally, the simulated bunch length was compared with the experimental results.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2008.08.140Additional details
Identifiers
- DOI
- 10.1016/j.nima.2008.08.140;
- PII
- S0168-9002(08)01322-3;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 597
- Journal Issue
- 2-3
- Journal Page Range
- p. 126-131
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41009464
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COMPRESSION; COMPRESSORS; ELECTRONS; LENGTH; PHOTOCATHODES; SPACE CHARGE; SYNCHROTRON RADIATION; TIME RESOLUTION
- Descriptors DEC
- BREMSSTRAHLUNG; CATHODES; DIMENSIONS; ELECTRODES; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; RADIATIONS; RESOLUTION; TIMING PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.