Published December 1, 2008 | Version v1
Journal article

Effects of emittance and space-charge in femtosecond bunch compression

  • 1. Institute of Scientific and Industrial Research (ISIR), Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-0047 (Japan)

Description

Ultrashort electron bunches of the order of <100fs are essential for the study of ultrafast reactions and phenomena by means of time-resolved pump-probe experiments. In order to generate such an electron bunch, the effects of emittance, space-charge (SC) and coherent synchrotron radiation (CSR) on the bunch length in a femtosecond magnetic bunch compressor were studied theoretically. It was observed that the bunch length is dominated by the emittance, SC and CSR effects when the electron bunch is compressed into a femtosecond electron bunch. The increases in bunch length due to the transverse emittance, SC and CSR effects in the bunch compressor were 1.7 fs/mm mrad, 107 fs/nC and 72 fs/nC, respectively. Finally, the simulated bunch length was compared with the experimental results.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2008.08.140

Additional details

Identifiers

DOI
10.1016/j.nima.2008.08.140;
PII
S0168-9002(08)01322-3;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
597
Journal Issue
2-3
Journal Page Range
p. 126-131
ISSN
0168-9002
CODEN
NIMAER

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41009464
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
COMPRESSION; COMPRESSORS; ELECTRONS; LENGTH; PHOTOCATHODES; SPACE CHARGE; SYNCHROTRON RADIATION; TIME RESOLUTION
Descriptors DEC
BREMSSTRAHLUNG; CATHODES; DIMENSIONS; ELECTRODES; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; RADIATIONS; RESOLUTION; TIMING PROPERTIES

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.