Published May 1993 | Version v1
Journal article

Spectroscopic study of x-ray emission of highly charged xenon, bismuth and uranium ions interacting with surfaces

  • 1. Lawrence Livermore National Laboratory, CA (United States)
  • 2. Univ. of Nevada, Reno, NV (United States)

Description

We have studied x-ray emission spectra arising from highly charged heavy Xeq+ (q=44-48), Biq+ (q=52-70) and Uq+ (q=61-73) ions interacting with Cu, Au and Be surfaces, respectively. The ions, with charge states q and energies of q x 7 keV, were extracted from an electron beam ion trap (EBIT) and directed towards a surface target. Characteristic line structures were observed as a function of the charge state q. To analyze such complex spectra many body perturbation theory in conjunction with screening methods has been used in order to predict radiative and Auger transition energies, transition probabilities and branching ratios. A detailed line assignment and comparison between experimental and theoretical results is presented for different number of electrons and holes distributed over up to 27 subshells taking relativistic and quantum electrodynamic contributions into account. The theoretical modeling of such exotic spectra attributed to the filling of specific vacancies can be demonstrated on PC-AT 386 or 486 computers in the atomic collision laboratory

Additional details

Publishing Information

Journal Title
Bulletin of the American Physical Society
Journal Volume
38
Journal Issue
3
Journal Page Range
p. 1165.WE105.
ISSN
0003-0503
CODEN
BAPSA6

Conference

Title
1993 American Physical Society annual meeting on atomic, molecular, and topical physics.
Dates
16-19 May 1993.
Place
Reno, NV (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
27080400
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BISMUTH IONS; ELECTRON BEAM ION SOURCES; ION COLLISIONS; SURFACES; URANIUM IONS; X-RAY EMISSION ANALYSIS; X-RAY SPECTRA; XENON IONS
Descriptors DEC
CHARGED PARTICLES; CHEMICAL ANALYSIS; COLLISIONS; ION SOURCES; IONS; NONDESTRUCTIVE ANALYSIS; SPECTRA

Optional Information

Secondary number(s)
CONF-9305421--.