Published July 1974
| Version v1
Journal article
Surface-barrier silicon detectors with low leakage currents
- 1. Joint Inst. for Nuclear Research, Dubna (USSR)
Description
no abstract available
Additional details
Additional titles
- Original title (Russian)
- Кремниевые поверхностно-барьерные детекторы с низкими токами утечки
Publishing Information
- Journal Title
- Prib. Tekh. Ehksp.
- Journal Issue
- no.4
- Series
- Prib. Tekh. Ehksp.
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 6171859
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALPHA SPECTRA; ELECTRIC POTENTIAL; ENERGY RESOLUTION; ETCHING; FABRICATION; LEAKAGE CURRENT; MEDIUM TEMPERATURE; MICRO AMP BEAM CURRENTS; N-TYPE CONDUCTORS; SI SEMICONDUCTOR DETECTORS; SURFACE BARRIER DETECTORS; VAPOR PLATING
- Descriptors DEC
- BEAM CURRENTS; CURRENTS; DEPOSITION; ELECTRIC CURRENTS; MEASURING INSTRUMENTS; PLATING; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR MATERIALS; SPECTRA; SURFACE COATING; SURFACE FINISHING
Optional Information
- Notes
- For English translation see the journal Instrum. Exp. Tech.