Published April 2005
| Version v1
Journal article
Investigations of Fe/Cr multilayer structures with ultrathin iron layers
- 1. P. L. Kapitza Institute for Physical Problems, Kosygina St. 2, 119334 Moscow (Russian Federation)
- 2. Institute of Metal Physics, Sofia Kovalevskaya St. 18, 620219 Ekaterinburg (Russian Federation)
Description
A set of Fe/Cr multilayer samples with ultrathin (few atomic dimensions) iron layers prepared by a molecular beam epitaxy was studied using SQUID magnetometry and ferromagnetic resonance technique. The samples with different iron layer thicknesses were investigated in a wide temperature range 4-400 K to study an evolution of magnetic properties of the system with diminishing of magnetic layer thickness. A strong change in magnetic properties was observed for samples with iron layer thicknesses less than 5 A. Possible reasons for such a behaviour are discussed
Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2004.11.171;
- PII
- S0304-8853(04)01432-5;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 290-291
- Journal Page Range
- p. 157-160
- ISSN
- 0304-8853
- CODEN
- JMMMDC
Conference
- Title
- Joint European magnetic symposia
- Acronym
- JEMS '04
- Dates
- 5-10 Sep 2004
- Place
- Dresden (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37026918
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHROMIUM; FERROMAGNETIC RESONANCE; IRON; LAYERS; MAGNETIC PROPERTIES; MOLECULAR BEAM EPITAXY; SQUID DEVICES; SUPERPARAMAGNETISM; TEMPERATURE RANGE 0000-0013 K; TEMPERATURE RANGE 0013-0065 K; TEMPERATURE RANGE 0065-0273 K; TEMPERATURE RANGE 0273-0400 K; THICKNESS; THIN FILMS
- Descriptors DEC
- CRYSTAL GROWTH METHODS; DIMENSIONS; ELECTRONIC EQUIPMENT; ELEMENTS; EPITAXY; EQUIPMENT; FILMS; FLUXMETERS; MAGNETIC RESONANCE; MAGNETISM; MEASURING INSTRUMENTS; METALS; MICROWAVE EQUIPMENT; PHYSICAL PROPERTIES; RESONANCE; SUPERCONDUCTING DEVICES; TEMPERATURE RANGE; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.