Microfabrication of electroluminescent polymer for devices construction
Description
Highlights: • Femtosecond-laser micromachining of MEH-PPV polymeric surface. • Surface roughness significantly increase upon increasing energy pulses and velocity. • Limit for ablation threshold and its influence on the absorption spectrum are shown. • The conditions and the fabrication of an electroluminescent device are reported. - Abstract: We report on the femtosecond-laser micromachining of poly[2-methoxy-5-(2-ethylhexyloxy)-1,4-phenylenevinylene] (MEH-PPV) films. We study the influence of pulse energy and scanning speed on the microstructures produced on sample surface. The microstructures were analyzed using an optical microscope and the morphology of the polymer film was obtained by atomic force microscopy (AFM). It has been found that the surface roughness of the investigated films is significantly increased upon increasing energy pulses and velocity. Furthermore, we report a limit for ablation threshold on the produced line microstructures and its influence on the absorption spectrum. In the end, we investigated the conditions for produce a luminescent mechanism and succeed in fabricating a microstructured MEH-PPV device
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2014.07.074Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2014.07.074;
- PII
- S0169-4332(14)01602-X;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 314
- Journal Page Range
- p. 633-637
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46106922
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ABLATION; ABSORPTION SPECTRA; ATOMIC FORCE MICROSCOPY; AUGMENTATION; ELECTROLUMINESCENCE; FABRICATION; FILMS; LASER BEAM MACHINING; LASERS; MICROSTRUCTURE; MORPHOLOGY; OPTICAL MICROSCOPES; POLYMERS; PULSES; ROUGHNESS; SURFACES; VELOCITY
- Descriptors DEC
- EMISSION; LUMINESCENCE; MACHINING; MICROSCOPES; MICROSCOPY; PHOTON EMISSION; SPECTRA; SURFACE PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.