Published June 20, 1985
| Version v1
Journal article
Linearity of pMOS radiation dosimeters operated at zero bias
- 1. Fulmer Research Inst. Ltd., Stoke Poges (UK)
- 2. European Space Research and Technology Centre, Noordwijk (Netherlands)
Description
A new mode of operation of pMOS radiation dosimeters is explored, using zero applied oxide field. Over a certain dose range, a linear dependence of response against dose was found. Charge pumping currents and threshold voltages were measured as a function of dose. (author)
Additional details
Publishing Information
- Journal Title
- Electron. Lett.
- Journal Volume
- 21
- Journal Issue
- 13
- Series
- Electron. Lett.
- Journal Page Range
- 570-571
- ISSN
- 0013-5194
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 16064981
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- DOSE RATES; DOSE-RESPONSE RELATIONSHIPS; DOSEMETERS; PHYSICAL RADIATION EFFECTS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR MATERIALS; SILICON OXIDES; SPACE CHARGE
- Descriptors DEC
- CHALCOGENIDES; MATERIALS; MEASURING INSTRUMENTS; OXIDES; OXYGEN COMPOUNDS; RADIATION EFFECTS; SILICON COMPOUNDS
Optional Information
- Contract/Grant/Project number
- Contract 3849/79/NL/AB