Published 1996 | Version v1
Book Metadata-only

Measurement of the spatial resolution of wide-pitch silicon strip detectors with large incident angle

Creators

  • 1. Osaka Univ. (Japan)

Description

As a part of R ampersand D for the BELLE experiment at KEK-B, we measured the spatial resolution of silicon strip detectors for particles with incident angles ranging from 0 degrees to 75 degrees. These detectors have strips with pitches of 50, 125 and 250 μm on the ohmic side. We have obtained the incident angle dependence which agreed well with a Monte Carlo simulation. The resolution was found to be 11 μm for normal incidence with a pitch of 50 μm, and 29 μm for incident angle of 75 degrees with a pitch of 250μm

Additional details

Publishing Information

Publisher
IEEE Service Center.
Imprint Place
Piscataway, NJ (United States)
Imprint Title
1996 IEEE nuclear science symposium - conference record. Volumes 1, 2 and 3
Imprint Pagination
2138 p.
Journal Page Range
p. 553-557.

Conference

Title
Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference.
Dates
2-9 Nov 1996.
Place
Anaheim, CA (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
28068908
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALGORITHMS; SI SEMICONDUCTOR DETECTORS; SPATIAL RESOLUTION
Descriptors DEC
MEASURING INSTRUMENTS; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS

Optional Information

Secondary number(s)
CONF-961123--.