Comparative study of porous amorphous a-Si1-xCx films and a-Si1-xCx membranes on structural and luminescence properties
Creators
- 1. Silicon Technology Development Unit (UDTS), 02 Bd, Frantz FANON, B.P. 140, Algiers (Algeria)
- 2. Houari Boumediene University (USTHB), Chemical and Mechanical Faculty, Algiers (Algeria)
- 3. Algerian Nuclear Research Center (CRNA), Algiers (Algeria)
- 4. Houari Boumediene University (USTHB), Physical Faculty, Algiers (Algeria)
Description
Electrochemical etching of amorphous SiC in fluoride solution was studied. Anodic dissolution and passivation are observed for p-type electrodes under dark illumination. The dissolution of p-type a-Si1-xCx is found to be under mixed transport/kinetic control; the diffusion current is of first order in fluoride concentration. Porous etching was not observed in this case. The surface finish of 6H-SiC depends on the experimental conditions; both uniform and porous etching is observed. In this paper, we report the formation of porous p-type amorphous SiC (a-Si1-xCx) films, elaborated previously by DC magnetron sputtering and analyze the porous layers (PSC) using scanning electron microscopy, spectrophotometer and photoluminescence. The crystal structures and the preparation conditions of porous SiC are shown to have an effect on the structural and electrical properties of the material obtained. SEM observation indicates that the porous a-Si1-xCx layers have shown some specific feature; a semi-cylindrical structure of the porous network has been observed. - Research highlights: →Macroporous amorphous silicon carbide (PSC) by anodization. →Membrane of amorphous silicon carbide by KOH etching. → Membrane a-Si1-xCx and PSC for humidity sensors. The work is not still published.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jlumin.2011.02.029Additional details
Identifiers
- DOI
- 10.1016/j.jlumin.2011.02.029;
- PII
- S0022-2313(11)00082-2;
Publishing Information
- Journal Title
- Journal of Luminescence
- Journal Volume
- 131
- Journal Issue
- 6
- Journal Page Range
- p. 1184-1188
- ISSN
- 0022-2313
- CODEN
- JLUMA8
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42083001
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANODIZATION; CRYSTAL STRUCTURE; DISSOLUTION; ELECTRICAL PROPERTIES; ELECTROCHEMISTRY; ETCHING; FILMS; FLUORIDES; HUMIDITY; ILLUMINANCE; MAGNETRONS; MEMBRANES; PASSIVATION; PHOTOLUMINESCENCE; POROUS MATERIALS; POTASSIUM HYDROXIDES; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDES; SPECTROPHOTOMETERS
- Descriptors DEC
- ALKALI METAL COMPOUNDS; CARBIDES; CARBON COMPOUNDS; CHEMICAL COATING; CHEMISTRY; CORROSION PROTECTION; DEPOSITION; ELECTROCHEMICAL COATING; ELECTROLYSIS; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EMISSION; EQUIPMENT; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; HYDROGEN COMPOUNDS; HYDROXIDES; LUMINESCENCE; LYSIS; MATERIALS; MEASURING INSTRUMENTS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; MOISTURE; OXYGEN COMPOUNDS; PHOTON EMISSION; PHYSICAL PROPERTIES; POTASSIUM COMPOUNDS; SILICON COMPOUNDS; SURFACE COATING; SURFACE FINISHING
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.