Published July 1982 | Version v1
Journal article Metadata-only

Atomic resolution observations of solute atom segregation to stacking faults in a Co-0.96 at.% Nb alloy

Creators

  • 1. Cornell Univ., Bard Hall, Dept. of Materials, Science and Engineering and the Materials Science Center, Ithaca, New York

Description

The authors present the results of an atom-probe field-ion microscope (FIM) study of niobium segregation to stacking faults in a Co-0.96 at % Nb alloy. Their atom-probe FIM allows them to determine the chemical identity of individual atoms with a mass (m) resolution of (Δm/m about1/200 (6-9). In addition, the atom-probe FIM has a lateral atomic resolution, for composition, of a few angstroms and therefore it is an ideal tool for studying solute segregation to stacking faults

Additional details

Publishing Information

Journal Title
Scr. Metall.
Journal Volume
16
Journal Issue
7
Series
Scr. Metall.
Journal Page Range
849-854
ISSN
0036-9748

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
15020685
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ATOMS; CHEMICAL COMPOSITION; COBALT BASE ALLOYS; ELECTRONIC STRUCTURE; ION MICROSCOPY; MASS RESOLUTION; NIOBIUM ALLOYS; SEGREGATION; STACKING FAULTS; TESTING
Descriptors DEC
ALLOYS; COBALT ALLOYS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; MICROSCOPY; RESOLUTION