Published August 1, 1995
| Version v1
Journal article
Relation between normal-state and superconductive properties of niobium sputtered films
- 1. Dipartimento di Scienze Fisiche, Universita di Napoli Federico II, Piazzale Tecchio 80, I-80125 Napoli (Italy)
- 2. Istituto Nazionale di Fisica Nucleare, Laboratori Nazionali di Legnaro, Via Romea 4, I-35100 Legnaro Padova (Italy)
Description
Data on niobium sputtered films obtained by different techniques are presented and discussed. The residual resistivity is shown to be determined by grain boundary scattering. It is then proven that, also in this case, the residual resistivity behaves as a ''universal'' parameter determining the detailed superconducting properties of the films. The effect of film nonuniformity in the growth direction is also discussed
Additional details
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter
- Journal Volume
- 52
- Journal Issue
- 6
- Journal Page Range
- p. 4473-4476.
- ISSN
- 0163-1829
- CODEN
- PRBMDO
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27004112
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CRYSTAL GROWTH; ELECTRIC CONDUCTIVITY; GRAIN BOUNDARIES; NIOBIUM; SPUTTERING; SUPERCONDUCTING FILMS; TEMPERATURE DEPENDENCE
- Descriptors DEC
- CRYSTAL STRUCTURE; ELECTRICAL PROPERTIES; ELEMENTS; FILMS; METALS; MICROSTRUCTURE; PHYSICAL PROPERTIES; TRANSITION ELEMENTS