Published June 11, 2008
| Version v1
Journal article
Micrometric scale measurement of material structure moving utilizing μ-radiographic technique
Creators
- 1. Institute of Theoretical and Applied Mechanics of the Czech Academy of Sciences, Prosecka 76, Prague 9 (Czech Republic)
- 2. Institute of Experimental and Applied Physics of the Czech Technical University in Prague, Horska 3a/22, 128 00 Prague 2 (Czech Republic)
Description
Studies concerning the functionality and integrity of the loaded materials require information about their mechanical behavior. Consequently, the displacement field of the loaded material has to be studied for this purpose. Although it is quite a common problem, new challenges arise when one is interested about displacement field of the micrometric scale. One promising solution is utilizing the μ-radiographic technique. Generally, the measurement of the displacement field requires some marks which can be followed as moving objects during loading. Radiographic studies of mechanical behavior of alloys or composite materials can benefit from their natural microstructure, which can be utilized as natural mark fields
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2008.03.019Additional details
Identifiers
- DOI
- 10.1016/j.nima.2008.03.019;
- PII
- S0168-9002(08)00393-8;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 591
- Journal Issue
- 1
- Journal Page Range
- p. 24-27
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 9. international workshop on radiation imaging detectors
- Dates
- 22-26 Jul 2007
- Place
- Erlangen (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40033933
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALLOYS; COMPOSITE MATERIALS; LOADING; MATHEMATICAL SOLUTIONS; MICROSTRUCTURE; PATTERN RECOGNITION; X-RAY RADIOGRAPHY
- Descriptors DEC
- INDUSTRIAL RADIOGRAPHY; MATERIALS; MATERIALS HANDLING; MATERIALS TESTING; NONDESTRUCTIVE TESTING; TESTING
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.