Infrared stealth property based on semiconductor (M)-to-metallic (R) phase transition characteristics of W-doped VO2 thin films coated on cotton fabrics
Description
The infrared stealth fabric was prepared using W-doped VO2 (M) paints by the coating technology. The thermochromic W-doped VO2 (M) was synthesized through hydrolysis method and two-step calcinations under N2 atmosphere. The powders were evaluated by scanning electron microscopy, X-ray diffraction patterns and differential scanning calorimetry. The infrared emissivity of coated cotton fabric was measured by IR-2 Infrared Emissometer, which was as low as 0.752. The low infrared radiation intensity for coated cotton fabric was detected using the infrared imaging systems above the phase temperature of W-doped VO2 (M). The results indicated that the W-doped VO2 (M) thin films exhibited thermal infrared stealth performance, which could adapt to the surroundings spontaneously. - Highlights: • The infrared stealth cotton fabric was coated by W-doped VO2 as the filler. • The emissivity of coated fabric was 0.752. • The abrupt amount in the emissivity of coated fabric was 0.2 in the phase transition. • The infrared stealth cotton fabric was adaptable to the surroundings spontaneously
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2014.02.055Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2014.02.055;
- PII
- S0040-6090(14)00190-4;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 558
- Journal Page Range
- p. 208-214
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47003524
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CALCINATION; CALORIMETRY; COTTON; DOPED MATERIALS; EMISSIVITY; HYDROLYSIS; INFRARED RADIATION; PHASE TRANSFORMATIONS; POWDERS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; THIN FILMS; TUNGSTEN COMPOUNDS; VANADIUM OXIDES; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL REACTIONS; COHERENT SCATTERING; DECOMPOSITION; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; FILMS; LYSIS; MATERIALS; MICROSCOPY; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; PYROLYSIS; RADIATIONS; REFRACTORY METAL COMPOUNDS; SCATTERING; SOLVOLYSIS; SURFACE PROPERTIES; THERMOCHEMICAL PROCESSES; TRANSITION ELEMENT COMPOUNDS; VANADIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.