Published 2001
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Total reflection X-ray fluorescence with synchrotron radiation applied to biological and environmental samples
Creators
- 1. Civil Engineering Faculty, UNICAMP, Campinas, SP (Brazil)
- 2. Civil Engineering Faculty, UNICAMP, Campinas, SP (BR)
- 3. Federal University of Rio de Janeiro-UFRJ/COPPE, Rio de Janeiro, RJ (BR)
- 4. National Synchroton Light Laboratory-LNLS, Campinas, SP (BR)
- 5. Sao Paulo University-ESALQ/CENA, Piracicaba, SP (BR)
- 6. Nutrition Institute-Federal University of Rio de Janeiro, Rio de Janeiro (BR)
Description
Full text: The Total Reflection X-ray Fluorescence has been applied for trace elements in water and aqueous solutions, environmental samples and biological materials after sample preparation and to surface analysis of silicon wafers. The present paper shows some results of applications for rainwater, atmospheric particulate material, colostrum and nuclear samples. (author)
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Additional details
Publishing Information
- Imprint Title
- International symposium on utilization of accelerators. Book of extended synopses
- Imprint Pagination
- 185 p.
- Journal Page Range
- p. 124
- Report number
- IAEA-SM--366
Conference
- Title
- International symposium on utilization of accelerators
- Dates
- 26-30 Nov 2001
- Place
- Sao Paulo (Brazil)
INIS
- Country of Publication
- International Atomic Energy Agency (IAEA)
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 32068354
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AIR POLLUTION MONITORING; BIOLOGICAL MATERIALS; REFLECTION; SYNCHROTRON RADIATION; USES; WATER POLLUTION MONITORS; X-RAY FLUORESCENCE ANALYZERS
- Descriptors DEC
- BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; MATERIALS; MEASURING INSTRUMENTS; MONITORING; MONITORS; RADIATIONS
Optional Information
- Secondary number(s)
- IAEA-SM--366/157