Discrete tomography of demanding samples based on a modified SIRT algorithm
- 1. Department of Chemistry and Center for NanoScience (CeNS), University of Munich - LMU, Butenandtstr. 5-13 (E), 81377 Munich (Germany)
- 2. CSHR, Italian Institute of Technology (IIT), C. so Trento 21, 10129 Turin (Italy)
- 3. Walter Schottky Institute, Technische Universität München, Am Coulombwall 3, 85748 Garching (Germany)
Description
The 3D structure of three particularly challenging samples was reconstructed by electron tomography. Due to sample limitations resulting in a large missing wedge and large tilt increments respectively the 3D structure could not be reconstructed by standard iterative algorithms; even a recently developed discrete algorithm failed until the input parameters for discrete reconstruction were improved. These challenges were addressed by adding a mask in each step of the preceding standard iterative reconstruction, setting all voxels known to be vacuum as zero, thus improving the segmentation and the 3D starting model. The position of these vacuum voxels is obtained from TEM images or other measurement data. -- Highlights: ► Input parameters for discrete tomography are usually obtained from preceding conventional algorithms. ► In each conventional iteration step we add a mask setting known vacuum voxels to zero. ► This improves segmentation parameters and the starting model for discrete tomography. ► We demonstrate the method for a series of only 9 exposures and two series with a tilt range of only ±40°.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2012.01.015Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2012.01.015;
- PII
- S0304-3991(12)00027-7;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 115
- Journal Issue
- Complete
- Journal Page Range
- p. 41-49
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45025514
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALGORITHMS; ELECTRONS; IMAGE PROCESSING; IMAGES; ITERATIVE METHODS; MASKING; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- CALCULATION METHODS; DIAGNOSTIC TECHNIQUES; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MATHEMATICAL LOGIC; MICROSCOPY; PROCESSING
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.