Published April 2012 | Version v1
Journal article

Discrete tomography of demanding samples based on a modified SIRT algorithm

  • 1. Department of Chemistry and Center for NanoScience (CeNS), University of Munich - LMU, Butenandtstr. 5-13 (E), 81377 Munich (Germany)
  • 2. CSHR, Italian Institute of Technology (IIT), C. so Trento 21, 10129 Turin (Italy)
  • 3. Walter Schottky Institute, Technische Universität München, Am Coulombwall 3, 85748 Garching (Germany)

Description

The 3D structure of three particularly challenging samples was reconstructed by electron tomography. Due to sample limitations resulting in a large missing wedge and large tilt increments respectively the 3D structure could not be reconstructed by standard iterative algorithms; even a recently developed discrete algorithm failed until the input parameters for discrete reconstruction were improved. These challenges were addressed by adding a mask in each step of the preceding standard iterative reconstruction, setting all voxels known to be vacuum as zero, thus improving the segmentation and the 3D starting model. The position of these vacuum voxels is obtained from TEM images or other measurement data. -- Highlights: ► Input parameters for discrete tomography are usually obtained from preceding conventional algorithms. ► In each conventional iteration step we add a mask setting known vacuum voxels to zero. ► This improves segmentation parameters and the starting model for discrete tomography. ► We demonstrate the method for a series of only 9 exposures and two series with a tilt range of only ±40°.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2012.01.015

Additional details

Identifiers

DOI
10.1016/j.ultramic.2012.01.015;
PII
S0304-3991(12)00027-7;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
115
Journal Issue
Complete
Journal Page Range
p. 41-49
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45025514
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALGORITHMS; ELECTRONS; IMAGE PROCESSING; IMAGES; ITERATIVE METHODS; MASKING; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
CALCULATION METHODS; DIAGNOSTIC TECHNIQUES; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MATHEMATICAL LOGIC; MICROSCOPY; PROCESSING

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.