Published 1979
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Quantitative SIMS analysis of decalibrated Chromel versus Alumel thermocouples using indexed sensitivity factors
Description
Secondary ion mass spectrometry (SIMS) is used to determine the failure mode responsible for the large decalibrations observed in sheathed, MgO-insulated Chromel versus Alumel, compacted thermocouple assemblies, exposed to temperatures above 11000C. Thermocouples sheathed in Inconel-600 and type 304 stainless steel were studied in this work. Quantified SIMS data showed that the observed decalibrations were due to significant alterations that took place in the Chromel and Alumel thermoelements. The amount of alteration was different for each thermocouple and was influenced by the particular sheath material used in the thermocouple construction
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS, PC A02/MF A01.Files
10495154.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 2 p.
- Report number
- CONF-790658--4
Conference
- Title
- 27. annual conference on mass spectrometry and allied topics.
- Dates
- 3 - 8 Jun 1979.
- Place
- Seattle, WA, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 10495154
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CALIBRATION; COMPARATIVE EVALUATIONS; ION MICROPROBE ANALYSIS; MASS SPECTROSCOPY; SENSITIVITY; THERMOCOUPLES
- Descriptors DEC
- CHEMICAL ANALYSIS; MEASURING INSTRUMENTS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; SPECTROSCOPY