Wide-angle X-ray diffraction of materials comprising layer-type molecules

The shapes of the wide-angle X-ray reflexion profiles produced by materials comprising layer-type molecules, such as carbon fibres and pyrolytic graphites, are affected by distortions, sizes and preferential orientation of the crystallites. In the present study, the diffraction intensity distribution of layer-type materials has been deduced theoretically as a function of structural parameters and measuring direction. The reflexion profiles of carbon fibres have been simulated to investigate the effects of structural parameters on the modulation of the diffraction pattern. (orig.)