Published May 1, 2008
| Version v1
Journal article
Laser damage resistance of hafnia thin films deposited by electron beam deposition, reactive low voltage ion plating, and dual ion beam sputtering
Description
A comparative study is made of the laser damage resistance of hafnia coatings deposited on fused silica substrates with different technologies: electron beam deposition (from Hf or HfO2 starting material), reactive low voltage ion plating, and dual ion beam sputtering.The laser damage thresholds of these coatings are determined at 1064 and 355 nm using a nanosecond pulsed YAG laser and a one-on-one test procedure. The results are associated with a complete characterization of the samples: refractive index n measured by spectrophotometry, extinction coefficient k measured by photothermal deflection, and roughness measured by atomic force microscopy
Additional details
Identifiers
- DOI
- 10.1364/AO.47.00C107;
Publishing Information
- Journal Title
- Applied Optics
- Journal Volume
- 47
- Journal Issue
- 13
- Journal Page Range
- p. C107-C113
- ISSN
- 0003-6935
- CODEN
- APOPAI
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40003251
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; COATINGS; ELECTRIC POTENTIAL; ELECTRON BEAMS; ELECTROPLATING; HAFNIUM; HAFNIUM OXIDES; ION BEAMS; NEODYMIUM LASERS; REFRACTIVE INDEX; ROUGHNESS; SILICA; SPECTROPHOTOMETRY; SPUTTERING; SUBSTRATES; THIN FILMS
- Descriptors DEC
- BEAMS; CHALCOGENIDES; DEPOSITION; ELECTRODEPOSITION; ELECTROLYSIS; ELEMENTS; FILMS; HAFNIUM COMPOUNDS; LASERS; LEPTON BEAMS; LYSIS; METALS; MICROSCOPY; MINERALS; OPTICAL PROPERTIES; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; PHYSICAL PROPERTIES; PLATING; REFRACTORY METAL COMPOUNDS; REFRACTORY METALS; SOLID STATE LASERS; SURFACE COATING; SURFACE PROPERTIES; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2008 Optical Society of America