Published 1996 | Version v1
Book

Mapping high pressure Bridgman Cd0.8Zn0.2Te from Russia

  • 1. Hebrew Univ. of Jerusalem (Israel)
  • 2. Sandia National Lab., Livermore, CA (United States)

Description

Mapping of single crystals of Cd(1-x)ZnTe (x=0.2) grown in Russia by the high pressure vertical Bridgman method, (HPVBM) under argon pressure of 2 to 10 Mpa was performed using, X-ray fluorescence (XRF), X-ray diffraction (XRD), Photoluminescence (PL) and leakage current uniformity. The crystals were more uniform in Zn composition than US produced material but had a poorer crystallinity and in the best case could only count nuclear radiation. Differences in the material properties between Russian and US material will be described

Additional details

Publishing Information

Publisher
IEEE Service Center.
Imprint Place
Piscataway, NJ (United States)
Imprint Title
1996 IEEE nuclear science symposium - conference record. Volumes 1, 2 and 3
Imprint Pagination
2138 p.
Journal Page Range
p. 647-650.

Conference

Title
Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference.
Dates
2-9 Nov 1996.
Place
Anaheim, CA (United States).

Optional Information

Secondary number(s)
CONF-961123--.