Published February 29, 2004 | Version v1
Journal article

Thick film growth of high optical quality low loss (0.1 dB cm-1) Nd:Gd3Ga5O12 on Y3Al5O12 by pulsed laser deposition

Description

Thick film growth of high optical quality Nd:Gd3Ga5O12 (Nd:GGG) on Y3Al5O12 (YAG) is reported, using the pulsed laser deposition (PLD) technique. Nd:GGG films with thickness up to 135 μm have been grown via sequential deposition runs and up to 40 μm in a single deposition. X-ray diffraction analysis shows that epitaxial growth has occurred and also confirms that the thick Nd:GGG films are single crystal. Analysis by Rutherford backscattering spectrometry shows that the stoichiometry of the thick Nd:GGG films is close to that of bulk Nd:GGG. The thick Nd:GGG films have fluorescence and absorption properties similar to that of bulk Nd:GGG, but slightly broadened. The Findlay-Clay technique of loss calculation has yielded a value of 0.1 dB cm-1 as an estimate of the propagation loss of one of the thick Nd:GGG films that we have subsequently used as a laser medium

Additional details

Identifiers

DOI
10.1016/j.apsusc.2003.09.039;
PII
S016943320301170X;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
223
Journal Issue
4
Journal Page Range
p. 361-371
ISSN
0169-4332
CODEN
ASUSEE

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.