Asymmetric interface band alignments of Cu2O/ZnO and ZnO/Cu2O heterojunctions
Description
Highlights: •We fabricated reverse ordered Cu2O–ZnO heterojunctions by magnetron sputtering. •An obvious asymmetry was observed in the VBOs of Cu2O/ZnO–ZnO/Cu2O by XPS. •We analyzed the asymmetry by d–p electronic repulsion in the valence band of Cu2O. •Growth order can affect crystal structure of the top layer of the heterojunction. -- Abstract: X-ray photoelectron spectroscopy was used to investigate the valence-band offsets (VBOs) of the Cu2O–ZnO heterojunctions fabricated by magnetron sputtering. A significant forward–backward asymmetry was observed in the band alignments of Cu2O/ZnO–ZnO/Cu2O heterojunctions. The valence band offsets of 2.91 eV and 2.52 eV were achieved in Cu2O/ZnO and ZnO/Cu2O heterojunctions respectively. The asymmetry was attributed to the lattice distortion of the Cu2O at the interface of Cu2O/ZnO heterojunction. The compressed Cu2O lattices lead to the upward shift of the top of the valence-band of Cu2O, and thus the measured VBO of Cu2O/ZnO is larger than that of ZnO/Cu2O. Considering the band alignments, the ZnO/Cu2O structure is expected to have more advantage in photovoltaic application than Cu2O/ZnO structure
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2013.05.033Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2013.05.033;
- PII
- S0925-8388(13)01193-6;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 578
- Journal Page Range
- p. 143-147
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45044550
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COPPER OXIDES; CRYSTAL STRUCTURE; HETEROJUNCTIONS; INTERFACES; MAGNETRONS; PHOTOVOLTAIC EFFECT; SPUTTERING; X-RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; COPPER COMPOUNDS; ELECTRON SPECTROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; MICROWAVE EQUIPMENT; MICROWAVE TUBES; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRIC EFFECT; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTOR JUNCTIONS; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.