Stress measurements by means of neutron diffraction
Description
The method of neutron diffraction for measuring the residual stress state in the interior of crystalline materials, is studied. This method is based upon the precise determination of the distance between crystalline lattice planes. Besides the presentation of the mathematical tools necessary, an overview is given of the experimental set-up required. The solution of alignment problems and the use of the set-up for actual measurements comprise an important part of the work described. The results obtained by means of neutron diffraction are compared to those obtained by using two other stress determination methods. In the first place this is the well established experimental technique of x-ray diffraction and secondly a theoretical technique, based on finite element calculations. The results of the measurements presented have been limited to ultra low carbon steel. However, by measurements at a ceramic material it was shown that the technique can be used at any crystalline material. As far as the steel type specimens are concerned, measurements have been carried out on several quenched cylinders and on a cold rolled plate. Both types of samples possess residual stresses that are characteristic for their production process. Base on the results, an evaluation is made of the requirements for instrumentation that performs stress measurements by means of neutron diffraction with an optimum result in the shortest possible measurement time. (author). 63 refs.; 46 figs.; 11 tabs
Availability note (English)
Photo-copies available from Library KNAW; P.O. Box 41950, 1009 DD Amsterdam, The Netherlands.Additional details
Publishing Information
- ISBN
- 90-9004210-5
- Imprint Pagination
- 172 p.
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 23013826
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Thesis, Non-conventional Literature
- Descriptors DEI
- CRYSTAL LATTICES; NEUTRON DIFFRACTION; RESIDUAL STRESSES; STRESS ANALYSIS
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; SCATTERING; STRESSES
Optional Information
- Notes
- This work was part of the research programme of the Netherlands Energy Research Foundation ECN at Petten, and carried out in co-operation with the Foundation for Advanced Metals Science (SGM) at Enschede; Includes summary in Dutch.