Published April 18, 2018 | Version v1
Journal article

Electron induced ionization of plasma processing gases: C4Fx (x  =  1–8) and the isomers of C4F6 and C4F8

  • 1. Plasma Technology Research Center, National Fusion Research Institute, 37 Dongjangsan-ro, Gunsan, Jeollabuk-do 54004 (Korea, Republic of)

Description

The total ionization cross section (Q ion) for C4Fx (x  =  1–8) fluorocarbons and the isomers of C4F6 and C4F8 molecules are calculated from ionization threshold to 5 keV using the binary-encounter bethe method. The targets are fully optimized using the Hartree–Fock (HF) method and density function theory (DFT) for their minimum energy structure and orbital parameters. The present Q ion with HF parameters showed good agreement with the experimental data for 1,3-C4F6, 2-C4F6, 2-C4F8 and 1-C4F8. On the other hand, the Q ion with DFT parameters are in good accordance with the recent theoretical results for 1,3-C4F6 and 2-C4F6. The Q ion for c-C4F8 showed much variation among the various results. The isomer effect in Q ion is negligible for the isomers of C4F6 and C4F8 molecules. The calculation of Q ion for C4F, C4F2, C4F3, C4F4, C4F5, c-C4F6, C4F7 and iso-C4F8 is a maiden attempt. The present cross section data are important quantities for low temperature plasma modeling especially related to the fluorocarbon plasmas. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1361-6463/aab1e3

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Physics. D, Applied Physics
Journal Volume
51
Journal Issue
15
Journal Page Range
[10 p.]
ISSN
0022-3727
CODEN
JPAPBE

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
53007998
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S74: ATOMIC AND MOLECULAR PHYSICS;
Descriptors DEI
COMPUTERIZED SIMULATION; CROSS SECTIONS; DENSITY; ELECTRONS; HARTREE-FOCK METHOD; IONIZATION; ISOMERS; MOLECULES; PLASMA
Descriptors DEC
APPROXIMATIONS; CALCULATION METHODS; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; PHYSICAL PROPERTIES; SIMULATION