Published February 8, 2012 | Version v1
Journal article

The calculation of semipolar orientations for wurtzitic semiconductor heterostructures: application to nitrides and oxides

  • 1. Clermont Université, Université Blaise Pascal, LASMEA, BP 10448, F-63000 Clermont-Ferrand (France)
  • 2. Laboratoire Charles Coulomb, UMR 5221, Université Montpellier 2, F-34095, Montpellier (France)
  • 3. Department of Physics, University Oran Es Senia, LEMOP, Oran 31100 (Algeria)

Description

We investigate how the template crystal orientation indices (hk. l) can influence the intensity of density of elastic energy and polarization fields in wurtzite nitrides and oxides semiconductor strained layer heterostructures. We propose analytical relations between the angle Θ, defined as the direction of the sixfold axis of unstrained material and the direction normal to the growth plane, and (i) the value of the total polarization and (ii) the density of elastic energy stored in the strained layer. We find that quasi-cancellation of quantum confined stark effect (QCSE) can be generally obtained by carefully selecting the (hk. l) set. This situation does not lead to minimal strain density of elastic energy, but the increase of this parameter may be moderate compared to the minimum value. In the case of materials submitted to biaxial tension, we observe that the total density of elastic energy stored shows no minimum except when Θ = 0

Availability note (English)

Available from http://dx.doi.org/10.1088/0268-1242/27/2/024009

Additional details

Identifiers

DOI
10.1088/0268-1242/27/2/024009;
PII
S0268-1242(12)03571-1;

Publishing Information

Journal Title
Semiconductor Science and Technology
Journal Volume
27
Journal Issue
2
Journal Page Range
[10 p.]
ISSN
0268-1242
CODEN
SSTEET

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45014277
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
CRYSTALS; DENSITY; LAYERS; OXIDES; POLARIZATION; SEMICONDUCTOR MATERIALS; STARK EFFECT; STRAINS
Descriptors DEC
CHALCOGENIDES; MATERIALS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES