Published April 14, 2014 | Version v1
Journal article

Super-dense array of Ge quantum dots grown on Si(100) by low-temperature molecular beam epitaxy

  • 1. Novosibirsk State University, Novosibirsk 630090 (Russian Federation)
  • 2. A.V. Rzhanov Institute of Semiconductor Physics, Lavrentyev Avenue 13, Novosibirsk 630090 (Russian Federation)

Description

Ge layer grown on Si(100) at the low temperature of ∼100 °C by molecular beam epitaxy is studied using scanning tunneling microscopy and Raman spectroscopy. It is found that crystalline and pseudomorphic to the Si substrate Ge islands are formed at the initial growth stage. The islands acquire the base size of 1.2–2.6 nm and they form arrays with the super-high density of (5–8) × 1012 cm−2 at 1–2 nm Ge coverages. Such a density is at least 10 times higher than that of Ge "hut" clusters grown via the Stranski-Krastanov growth mode. It is shown that areas between the crystalline Ge islands are filled with amorphous Ge, which is suggested to create potential barrier for holes localized within the islands. As a result, crystalline Ge quantum dots appear being isolated from each other

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
115
Journal Issue
14
Journal Page Range
p. 144306-144306.5
ISSN
0021-8979
CODEN
JAPIAU

Optional Information

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