Published March 1988
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Electron spectroscopy in the X-ray range for occupied and free levels and the application to transition metal silicides
Description
Intermetallic compounds of transition metals are investigated by means of XPS, Bremsstrahlung Isochromate Spectroscopy and XAS. Occupied and free levels are characterized and moreover a systematic overview over the electronic structure of the transition element silicides is given. (BHO)
Availability note (English)
MF available from INIS under the Report Number.
Files
Additional details
Additional titles
- Original title (German)
- Elektronenspektroskopie im Roentgenbereich von besetzten und unbesetzten Zustaenden und die Anwendung auf Uebergangsmetallsilizide
Publishing Information
- Imprint Pagination
- 125 p.
- Report number
- Juel--2189
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 20006959
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Numerical Data, Thesis
- Descriptors DEI
- ABSORPTION SPECTRA; BREMSSTRAHLUNG; ELECTRONIC STRUCTURE; ENERGY LEVELS; EXPERIMENTAL DATA; FERMI LEVEL; INTERMETALLIC COMPOUNDS; MATRIX ELEMENTS; NUMERICAL SOLUTION; PHOTOEMISSION; SILICIDES; TRANSITION ELEMENT COMPOUNDS; X RADIATION; X-RAY SPECTRA
- Descriptors DEC
- ALLOYS; DATA; ELECTROMAGNETIC RADIATION; EMISSION; INFORMATION; IONIZING RADIATIONS; NUMERICAL DATA; RADIATIONS; SECONDARY EMISSION; SILICON COMPOUNDS; SPECTRA