Published September 2009 | Version v1
Journal article

Improvements in the absolute standardization of large-area reference sources

  • 1. National Institute of R and D for Physics and Nuclear Engineering 'Horia Hulubei', IFIN-HH, P.O. Box MG-6, Bucharest-Magurele R-077125 (Romania)
  • 2. ENEA- Instituto Nationale di Metrologia delle Radiazioni Ionozzanti, INMR, C.R. Casaccia, P.O. Box 2400, 00100 Rome, A.D. (Italy)

Description

Using a simple gas-gain model, the efficiency sensitivity of gas-flow proportional counters to changes in the influence quantities (applied anode voltage, gas purity, gas-flow rate, ambient pressure and temperature) was analyzed and applied for the absolute standardization of large-area reference sources. Thus, the uncertainty of measurement was evaluated by taking into account the fluctuations of these quantities in normal conditions of counter operation. It was shown that the uncertainty is small in these conditions but accidental and large changes in the influence quantities may give rise to large errors of measurement. In addition, a cleaning procedure and a simple way of stabilizing the gain of gas-flow proportional counters were used to improve the absolute standardization of large-area reference sources. As a result, measurements were performed with uncertainties smaller than 0.55% and the reproducibility better than 0.42%.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apradiso.2009.03.056

Additional details

Identifiers

DOI
10.1016/j.apradiso.2009.03.056;
PII
S0969-8043(09)00331-5;

Publishing Information

Journal Title
Applied Radiation and Isotopes
Journal Volume
67
Journal Issue
9
Journal Page Range
p. 1716-1720
ISSN
0969-8043
CODEN
ARISEF

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41017928
Subject category
S07: ISOTOPES AND RADIATION SOURCES;
Descriptors DEI
CLEANING; FLUCTUATIONS; GAS FLOW; PROPORTIONAL COUNTERS; SENSITIVITY; STANDARDIZATION
Descriptors DEC
FLUID FLOW; MEASURING INSTRUMENTS; RADIATION DETECTORS; VARIATIONS

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.