Published September 1997 | Version v1
Miscellaneous Open

The study of influence of the duration of formation of p+-layer on the process of radiation defect production in silicon structures

  • 1. AN RU, Tashkent (Uzbekistan). Inst. Yadernoj Fiziki

Description

The radiation defects production in silicon p+-structures under electron, proton and neutron irradiation was studied using the method of non-stationary capacity spectroscopy of deep levels. It was shown that independently from p+-formation duration three types of radiation defects were formed: A-centers, E-centers and divacancies. (A.A.D.)

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Part of:
Radon-222 and radon-222 progeny concentrations in six nonuranium mines in Transylvania (Romania)

Additional details

Additional titles

Original title (Russian)
Исследование влияния длительности формирования п

Publishing Information

Imprint Title
Abstracts of the second Uzbekistan conference on modern problems of nuclear physics
Imprint Pagination
196 p.
Journal Page Range
p. 143.
Report number
INIS-UZ--040

Conference

Title
2. Uzbekistan conference on modern problems of nuclear physics.
Dates
9-12 Sep 1997.
Place
Samarkand (Uzbekistan).

Optional Information