An experiment on the particle-wave nature of electrons
- 1. Department of Physics, University of Bologna, and CNISM, V/le B Pichat, 6/2, I 40127 Bologna (Italy)
- 2. CNR-IMM Sezione di Bologna, via Gobetti 101, I-40126 Bologna (Italy)
- 3. Institute of Physics, Universidad de Antioquia, AA 1226, Medellin (Colombia)
- 4. Physics School, Universidad Nacional de Colombia Sede MedellIn, AA 3840, Medellin (Colombia)
Description
A primary electron beam of a transmission electron microscope is scattered into secondary beams by the planes of atoms of a single crystal. These secondary beams are focused to form a diffraction pattern on the final screen. This experiment is similar to the Thompson one which, independently by Davisson and Germer, demonstrated the de Broglie hypothesis of the existence of electron waves. Without changing the experimental apparatus, it is possible to realize an interference experiment with electrons coming from two spatially separated sources in analogy with the optical Young set-up. Both experiments are clear evidence of the electron wave-like behaviour. By varying the conditions of illumination, changes of the fringe visibility which reveal the spatial coherence properties of the electron beam, are displayed
Availability note (English)
Available from http://dx.doi.org/10.1088/0143-0807/30/1/023Additional details
Identifiers
- DOI
- 10.1088/0143-0807/30/1/023;
- PII
- S0143-0807(09)94698-0;
Publishing Information
- Journal Title
- European Journal of Physics
- Journal Volume
- 30
- Journal Issue
- 1
- Journal Page Range
- p. 217-226
- ISSN
- 0143-0807
- CODEN
- EJPHD4
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40071344
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ELECTRON BEAMS; ELECTRON DIFFRACTION; ELECTRONS; INTERFERENCE; MONOCRYSTALS; SECONDARY BEAMS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- BEAMS; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; FERMIONS; LEPTON BEAMS; LEPTONS; MICROSCOPY; PARTICLE BEAMS; SCATTERING