Published April 17, 1989
| Version v1
Journal article
Observation of differences between low-energy electron- and positron-diffraction structural determinations of the cleavage faces of CdSe
- 1. Department of Physics, Brandeis University, Waltham, Massachusetts 02254
Description
Low-energy positron diffraction (LEPD) is used in conjunction with low-energy electron diffraction (LEED) to determine the relaxed atomic geometries of the CdSe cleavage surfaces. The LEPD analyses yield optimal fits at smaller top-layer perpendicular relaxations than LEED for both cleavage faces, and significantly better agreement between theoretical and experimental intensity profiles
Additional details
Publishing Information
- Journal Title
- Physical Review Letters
- Journal Volume
- 62
- Journal Issue
- 16
- Series
- Phys. Rev. Lett.
- Journal Page Range
- 1876-1879
- ISSN
- 0031-9007
- CODEN
- PRLTA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 20051925
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CADMIUM SELENIDES; CLEAVAGE; COMPARATIVE EVALUATIONS; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; ENERGY DEPENDENCE; OPTIMIZATION; POSITRON-ATOM COLLISIONS; SURFACES
- Descriptors DEC
- ATOM COLLISIONS; CADMIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; COLLISIONS; DIFFRACTION; EVALUATION; MICROSTRUCTURE; POSITRON COLLISIONS; SCATTERING; SELENIDES; SELENIUM COMPOUNDS