Structural surface characterization of ion nitrided AISI 4340 steel
Creators
- 1. Vocational School of Asim Kocabiyik, Kocaeli University, 41800 Hereke-Kocaeli (Turkey)
- 2. Engineering Faculty, Mechanical Eng. Dept., Kocaeli University, 41380 Izmit-Kocaeli (Turkey)
Description
Highlights: ► AISI 4340 steel was ion nitrided with different process time and temperatures. ► The case depth changes with increasing process time and temperature. ► Surface hardness also changes with increasing process time and temperature. ► Surface hardness is reduced at longer nitriding time. ► The surface roughness is increased by ion nitriding conditions. -- Abstract: AISI 4340 steel was ion nitrided using different time and temperature and the gathered properties were assessed by evaluating hardness profile, compound layer thickness, case depth and surface roughness by using microhardness tester, optical microscopy, surface profilometer and X-ray diffraction. It has been found that the thickness of the compound layer increases with increasing treatment time and temperature. The surface roughness, the surface hardness, the hardness profile, the case depth, the compound layer thickness, and phase content of the compound layer depend on nitriding parameters such as treatment time and temperature. Optimum ion nitriding parameters of component should be determined depending on the service conditions. For this reason, the effect of ion nitriding treatment parameters on structural properties of AISI 4340 steel was investigated.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matdes.2011.12.025Additional details
Identifiers
- DOI
- 10.1016/j.matdes.2011.12.025;
- PII
- S0261-3069(11)00854-5;
Publishing Information
- Journal Title
- Materials and Design
- Journal Volume
- 36
- Journal Page Range
- p. 741-747
- ISSN
- 0261-3069
- CODEN
- MADSD2
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45022448
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- LAYERS; MICROHARDNESS; OPTICAL MICROSCOPY; SURFACE TREATMENTS; SURFACES; THICKNESS; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; ELECTROMAGNETIC RADIATION; HARDNESS; IONIZING RADIATIONS; MECHANICAL PROPERTIES; MICROSCOPY; RADIATIONS; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.