Characterization of the Mid-Frequency Arrays for Advanced ACTPol
Creators
- 1. Princeton University, Joseph Henry Laboratories of Physics, Jadwin Hall (United States)
- 2. NIST, Quantum Sensors Group (United States)
- 3. University of Michigan, Department of Physics (United States)
- 4. Cornell University, Department of Physics (United States)
- 5. University of Pennsylvania, Department of Physics (United States)
- 6. NASA Goddard Space Flight Center (United States)
Description
The Advanced ACTPol upgrade on the Atacama Cosmology Telescope aims to improve the measurement of the cosmic microwave background anisotropies and polarization, using four new dichroic detector arrays fabricated on 150-mm silicon wafers. These bolometric cameras use AlMn transition-edge sensors, coupled to feedhorns with orthomode transducers for polarization sensitivity. The first deployed camera is sensitive to both 150 and 230 GHz. Here, we present the laboratory characterization of the thermal parameters and optical efficiencies for the two newest fielded arrays, each sensitive to both 90 and 150 GHz. We provide assessments of the parameter uniformity across each array with evaluation of systematic uncertainties. Lastly, we show the arrays' initial performance in the field.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Low Temperature Physics
- Journal Volume
- 193
- Journal Issue
- 3-4
- Journal Page Range
- p. 267-275
- ISSN
- 0022-2291
- CODEN
- JLTPAC
Conference
- Title
- International workshop on low temperature detectors
- Acronym
- LTD17
- Dates
- 17-21 Jul 2017
- Place
- Kurume City, Fukuoka (Japan)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50054305
- Subject category
- S42: ENGINEERING;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANISOTROPY; BOLOMETERS; CAMERAS; COSMOLOGY; EFFICIENCY; EVALUATION; GHZ RANGE; MICROWAVE RADIATION; PERFORMANCE; POLARIZATION; SENSITIVITY; SENSORS; SILICON; TELESCOPES; TRANSDUCERS
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELEMENTS; FREQUENCY RANGE; MEASURING INSTRUMENTS; RADIATIONS; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2018 Springer Science+Business Media, LLC, part of Springer Nature
- Notes
- http://www.springer-ny.com