Published November 2018 | Version v1
Journal article

Characterization of the Mid-Frequency Arrays for Advanced ACTPol

  • 1. Princeton University, Joseph Henry Laboratories of Physics, Jadwin Hall (United States)
  • 2. NIST, Quantum Sensors Group (United States)
  • 3. University of Michigan, Department of Physics (United States)
  • 4. Cornell University, Department of Physics (United States)
  • 5. University of Pennsylvania, Department of Physics (United States)
  • 6. NASA Goddard Space Flight Center (United States)

Description

The Advanced ACTPol upgrade on the Atacama Cosmology Telescope aims to improve the measurement of the cosmic microwave background anisotropies and polarization, using four new dichroic detector arrays fabricated on 150-mm silicon wafers. These bolometric cameras use AlMn transition-edge sensors, coupled to feedhorns with orthomode transducers for polarization sensitivity. The first deployed camera is sensitive to both 150 and 230 GHz. Here, we present the laboratory characterization of the thermal parameters and optical efficiencies for the two newest fielded arrays, each sensitive to both 90 and 150 GHz. We provide assessments of the parameter uniformity across each array with evaluation of systematic uncertainties. Lastly, we show the arrays' initial performance in the field.

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Low Temperature Physics
Journal Volume
193
Journal Issue
3-4
Journal Page Range
p. 267-275
ISSN
0022-2291
CODEN
JLTPAC

Conference

Title
International workshop on low temperature detectors
Acronym
LTD17
Dates
17-21 Jul 2017
Place
Kurume City, Fukuoka (Japan)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
50054305
Subject category
S42: ENGINEERING;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANISOTROPY; BOLOMETERS; CAMERAS; COSMOLOGY; EFFICIENCY; EVALUATION; GHZ RANGE; MICROWAVE RADIATION; PERFORMANCE; POLARIZATION; SENSITIVITY; SENSORS; SILICON; TELESCOPES; TRANSDUCERS
Descriptors DEC
ELECTROMAGNETIC RADIATION; ELEMENTS; FREQUENCY RANGE; MEASURING INSTRUMENTS; RADIATIONS; SEMIMETALS

Optional Information

Copyright
Copyright (c) 2018 Springer Science+Business Media, LLC, part of Springer Nature
Notes
http://www.springer-ny.com