Effect of acceptor Na1+ doping on the properties of perovskite SrCeO3
- 1. Indian Institute of Technology (BHU) Varanasi, Department of Physics (India)
- 2. Indian Institute of Technology Kanpur, Department of Material Science (India)
Description
The aim of this work is to study the effect of Na doping on the structural, microstructural and electrical properties of SrCeO3. With this goal, SrCe1−xNaxO3 (x = 0, 0.02, 0.04, 0.06 and 0.10) polycrystalline ceramics have been prepared using the solid-state route. The phase and structure of the synthesized samples were confirmed using X-ray diffraction technique. Rietveld refinement of the XRD profile confirmed that all the samples have orthorhombic structure and space group Pnma. Further, the purity of the synthesized samples was checked using Raman and Fourier transformation infrared (FTIR) spectroscopy techniques. The optical bandgap was calculated using UV–Vis technique, and the values were found 3.01 and 3.12 eV for pristine and Na doped samples. Scanning electron microscopic studies of fractured surfaces of the sintered pellets have indicated that dopant Na has played a significant role in grain growth. Grain size and morphology of Na doped samples is different from pristine SrCeO3. DC conductivity of Na doped samples is lower than undoped SrCeO3.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Materials Science. Materials in Electronics
- Journal Volume
- 30
- Journal Issue
- 16
- Journal Page Range
- p. 15772-15785
- ISSN
- 0957-4522
- CODEN
- JSMEEV
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52024121
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DOPED MATERIALS; ELECTRICAL PROPERTIES; FOURIER TRANSFORM SPECTROMETERS; GRAIN GROWTH; GRAIN SIZE; INFRARED SPECTRA; ORTHORHOMBIC LATTICES; PEROVSKITE; SCANNING ELECTRON MICROSCOPY; SPACE GROUPS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON MICROSCOPY; MATERIALS; MEASURING INSTRUMENTS; MICROSCOPY; MICROSTRUCTURE; MINERALS; OXIDE MINERALS; PEROVSKITES; PHYSICAL PROPERTIES; SCATTERING; SIZE; SPECTRA; SPECTROMETERS; SYMMETRY GROUPS; THREE-DIMENSIONAL LATTICES
Optional Information
- Copyright
- Copyright (c) 2019 Springer Science+Business Media, LLC, part of Springer Nature